MS5013 - Practical approach to TEM (2020 - Present, Jan - Apr)

Course Contents:

Introduction to EM, the necessity of characterisation using TEM techniques, brief introduction to crystallography, thinking in reciprocal space, TEM imaging and diffraction techniques (only limited to techniques available with us).

- Specimen Preparation techniques (twin jet polishing and ion milling, basic drop casting)

- TEM imaging, bright field and dark field

- STEM imaging

- Diffraction, reconstruction of unit cell and analysis

- Indexing diffraction patterns

- Analytical TEM techniques, EDX

- Practical sessions will be such that the students will be able to operate the microscope, carry out basic imaging, diffraction (BF/DF) and construct a unit-cell from diffraction patterns as well as carry out basic STEM-EDX analysis.

Recommended Books:

1. Transmission Electron Microscopy: A Textbook for Materials Science, Second Edition. David B. Williams and C. Barry Carter. Springer, New York, 2009,

2. Goodhew, Peter J., and John Humphreys. Electron microscopy and analysis. CRC Press, 2000.

Slides and Notes:

Lectures on understanding electron material interaction and diffraction:

1. Signals in the TEM

2. Diffraction in TEM & the Crystal Structure Problem

3. Structure Factor, revisiting 2D reciprocal lattice and millers indices

4. Reciprocal lattice in TEM, unit cell reconstruction and indexing

Slides PDF:

Assignment:

Lecture notes on crystallography (MS3290):