JEOL JIB 4700F Multibeam System
Institute Facility procured through MSME department JICA fund
- 4 hr4 hours
- IITH Main Road
The JEOL JIB 4700F Multibeam system is an FIB-SEM system that features a hybrid conical objective lens, GENTLEBEAM™ (GB) mode and an in-lens detector system to deliver a guaranteed resolution of 1.6nm at a low accelerating voltage of 1 kV. Using an "in-lens Schottky-emission electron gun" that produces an electron beam with a maximum probe-current of 300nA, this newly-developed instrument allows for high-resolution observations and fast analyses. For the FIB column, a high-current density Ga ion beam of up to 90nA maximum probe-current is employed for fast ion milling and processing of specimens. *Upon using this service and should the results lead to a publication you accept that you will acknowledge the user and the microscopy facility.
To cancel/reschedule, please contact us 24 hours in advance.
IIT Hyderabad, Academic Block-C, IITH Main Road, Kandi, Telangana, India