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JEOL JIB 4700F Multibeam System

Institute Facility procured through MSME department JICA fund

  • 4 hours
  • TBD
  • IITH Main Road

Service Description

The JEOL JIB 4700F Multibeam system is an FIB-SEM system that features a hybrid conical objective lens, GENTLEBEAM™ (GB) mode and an in-lens detector system to deliver a guaranteed resolution of 1.6nm at a low accelerating voltage of 1 kV. Using an "in-lens Schottky-emission electron gun" that produces an electron beam with a maximum probe-current of 300nA, this newly-developed instrument allows for high-resolution observations and fast analyses. For the FIB column, a high-current density Ga ion beam of up to 90nA maximum probe-current is employed for fast ion milling and processing of specimens. *Upon using this service and should the results lead to a publication you accept that you will acknowledge the user and the microscopy facility.

Cancellation Policy

To cancel/reschedule, please contact us 24 hours in advance.

Contact Details

  • IIT Hyderabad, Academic Block-C, IITH Main Road, Kandi, Telangana, India


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